| Instrument Type |
Vector, S-Parameter |
| Low end frequency limit |
30.00 kHz |
| High end frequency limit |
3.00 GHz |
| Output Power Range |
-- |
| Input Noise Level |
-- |
| Status |
discontinued |
Launch Date
| -- |
| Discontinued on | -- |
| Supported until | -- |
| Alternative | E5070B ENA RF Network Analyzer |
| See also | 8752C |
 Agilent HP 8753D Specs (1.72 MB)
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| Agilent HP 8753D Features : |
The 8753D vector network analyzer provides not only magnitude and phase information, but also offers up to 110 dB dynamic range, makes group delay and time domain measurements, and utilizes vector accuracy enhancement to minimize measurement uncertainty.
- Built-in S-parameter test set for complete forward and reverse measurements, allowing you to completely characterize your component with a single connection
- Superb accuracy, with the most comprehensive calibration available
- Optional time domain and swept harmonic measurements
- Mixer testing with frequency offset capability
- Optional step attenuator for extended source output power range
- Pass/fail testing, interpolative error correction, test sequencing, and user-defined test frequencies to enhance productivity
- Frequency range from 30 kHz to 3 GHz, or optionally 6 GHz.
- 50 and 75 ohm solutions
- Built-in S-parameter test set provides complete forward and reverse measurements,allowing you to completely characterize your component with a single connection
- Mixer testing; quickly and easily characterize frequency translating devices such as mixers
- Add swept harmonic measurements.Characterize amplifier parameters - gain, 1 dB compression, match - and 2nd and 3rd harmonic distortion with the same test setup
- Built-in 3.5 floppy disk
- Parallel and serial ports provide interfaces to popular printers and plotters
- Optional step attenuator for extended source output power range
- Pass/fail testing, interpolative error correction, test sequencing, and user-defined test frequencies to enhance productivity
- Two independent display channels for simultaneous measurement of reflection and transmission characteristics
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