| Seller Info :
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| Company :
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MetricTest
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| Contact Name :
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Sales Department
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| Company Info :
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MetricTest is a quality source for buying, renting and leasing new and refurbished electronic test equipment.
With over 6,000 products available, MetricTest offers test equipment for a variety of applications. MetricTest is an authorized dealer of Agilent (HP), Fluke, Fluke Networks, Advantest, Rohde & Schwarz, California Instruments, NTI, Instek and other leading brands.
As an ISO certified company, MetricTest has met quality standards of excellence.
MetricTest, located in Hayward, near Silicon Valley, has thousands of customers throughout the United States and around the world.
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| Sales Conditions : | We offer a 7-day no obligation free trial, and 1-year performance guarantee on most refurbished models.
We accept Visa, MasterCard, American Express and Discover.
NIST traceable/ISO registered lab & all standard accessories.
Pricing and availablity are subject to change.
Two New Worry-free & Flexible Rental Programs - month-to-month rentals and rent-to-own agreements. |
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(ATE)
(G.Lab)
(Semiconductors eq.)
(Rentals)
(Calibration)
(Repair)
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| Address :
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3486 Investment Blvd
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| Web :
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View Website
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| Phone :
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(800) 417-4370 |
| Fax :
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(510) 264-0886 |
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| Order manual from Manuals Plus |
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Agilent HP E4991A : Main Features and Specifications
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| Test Freq. Range Low |
1 MHz |
| Test Freq. Range High |
3 GHz |
| Resistance Range Low |
130 mOhm |
| Resistance Range High |
20 kOhm |
| Capacitance Range Low |
-- |
| Capacitance Range High |
-- |
| Measurements |
Z, L, Q, D, Phase, R, X, G, B, Y, Cs, Cp |
| Status |
new |
Launch Date
| -- |
| Discontinued on | -- |
| Supported until | -- |
 Agilent HP E4991A Specs (1.12 MB)
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| Agilent HP E4991A Features : |
- Basic accuracy +/-0.8%
- 3GHz impedance direct read-out
- Windows-styled user interface
- Sweep parameters (frequency, ac level, dc bias)
- Built-in VBA programming function
- Various test fixture for components
- Data transfer through the LAN interface
- Direct read-out permittivity, permeability [option]
- Reliable on-wafer measurement [option]
- Temperature characteristic measurement [option]
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