| Seller Info :
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| Company :
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Test Equipment Connection Corp.
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| Contact Name :
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testequipmentconnection
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| Company Info :
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Test Equipment Connection Corporation is the world’s largest vendor of New and Refurbished electronic test and measurement (“T&M”) equipment.
Test Equipment Connection sells, rents, leases, buys and repairs over 200 different T&M manufacturers with thousands of new and refurbished products available. Test Equipment Connection is a single source supplier with an in-house calibration laboratory assuring that customers receive only the highest quality T&M equipment and support. The Company has over 200,000 customers and a 40,000 square foot warehouse and repair facility.
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| Sales Conditions : | Our New Affiliate, TE Connection Asia Limited, is now operational and based in Hong Kong.
TE Connection Asia, Ltd.
Unit 13, 16 / FL Fotan Industrial Centre
26-28 Au Pui Wan Street
Fotan Shatin N.T. Hong Kong
www.TEConnectionAsia.com
Hong Kong Phone +852-2690-1360
Hong Kong Fax +852-2690-0638
China Phone + 86-755-8355-2154
China Fax +86-755-6164-0636 |
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(ATE)
(Semiconductors eq.)
(Rentals)
(Calibration)
(Repair)
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| Address :
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30 Skyline drive
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| Web :
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View Website
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| Phone :
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800-615-8378 | 407-804-1299 |
| Fax :
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800-819-8378 |
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| Order manual from Manuals Plus |
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Agilent HP E4991A : Main Features and Specifications
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| Test Freq. Range Low |
1 MHz |
| Test Freq. Range High |
3 GHz |
| Resistance Range Low |
130 mOhm |
| Resistance Range High |
20 kOhm |
| Capacitance Range Low |
-- |
| Capacitance Range High |
-- |
| Measurements |
Z, L, Q, D, Phase, R, X, G, B, Y, Cs, Cp |
| Status |
new |
Launch Date
| -- |
| Discontinued on | -- |
| Supported until | -- |
 Agilent HP E4991A Specs (1.12 MB)
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| Agilent HP E4991A Features : |
- Basic accuracy +/-0.8%
- 3GHz impedance direct read-out
- Windows-styled user interface
- Sweep parameters (frequency, ac level, dc bias)
- Built-in VBA programming function
- Various test fixture for components
- Data transfer through the LAN interface
- Direct read-out permittivity, permeability [option]
- Reliable on-wafer measurement [option]
- Temperature characteristic measurement [option]
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