Curve Tracer
A curve tracer is an electronic testing device used to troubleshoot circuits and to analyze components. It assesses the characteristics of numerous devices, including diodes and transistors. Function includes the application of a varying voltage to the main terminals of the instrument being tested. While this swept voltage is applied, a measurement is taken to determine the amount of current that flows through the device. The circuit traces the current and compares it to the voltage curve using an oscilloscope. The curve tracer includes integrated sources of voltage and current that are used to stimulate the instrument being tested.
Bipolar Junction Transistor (BJT)
A bipolar junction transistor (abbreviated as BJT) is an active semiconductor device made of doped materials and is characterized by three-terminal construction. Its function lies in the amplification of electric currents. Transistors of this type operate using both electrons and holes (hence the name "bipolar"), whereas unipolar transistors operate using only one carrier type when charging flow.
Bipolar Junction Transistor (BJT)
A bipolar junction transistor (abbreviated as BJT) is an active semiconductor device made of doped materials and is characterized by three-terminal construction. Its function lies in the amplification of electric currents. Transistors of this type operate using both electrons and holes (hence the name "bipolar"), whereas unipolar transistors operate using only one carrier type when charging flow.
Breakdown Voltage
Breakdown voltage (also called Zener voltage) refers to the minimum reverse voltage required to make a diode conduct in reverse. More generally, it is the voltage measured at a specific current in a diode's breakdown region or the voltage at which a breakdown will potentially occur in an electronic device.
Breakdown Voltage
Breakdown voltage (also called Zener voltage) refers to the minimum reverse voltage required to make a diode conduct in reverse. More generally, it is the voltage measured at a specific current in a diode's breakdown region or the voltage at which a breakdown will potentially occur in an electronic device.
Curve Tracer
A curve tracer is an electronic testing device used to troubleshoot circuits and to analyze components. It assesses the characteristics of numerous devices, including diodes and transistors. Function includes the application of a varying voltage to the main terminals of the instrument being tested. While this swept voltage is applied, a measurement is taken to determine the amount of current that flows through the device. The circuit traces the current and compares it to the voltage curve using an oscilloscope. The curve tracer includes integrated sources of voltage and current that are used to stimulate the instrument being tested.
Diode
A diode is a component of electronic instrumentation that allows current to flow in only one direction at a time and prevents that current from flowing in the opposite direction. A diode is, in part, comprised of two electrodes (an anode and a cathode) that act similarly to miniature semiconductors. The cathode is usually negatively charged in order to allow current to flow efficiently through the diode, as it will not flow at all if the voltage of the cathode and anode are charged to a similar voltage.
Diode
A diode is a component of electronic instrumentation that allows current to flow in only one direction at a time and prevents that current from flowing in the opposite direction. A diode is, in part, comprised of two electrodes (an anode and a cathode) that act similarly to miniature semiconductors. The cathode is usually negatively charged in order to allow current to flow efficiently through the diode, as it will not flow at all if the voltage of the cathode and anode are charged to a similar voltage.
I-V Curve
I-V curve (also called the current-voltage curve) refers to the relationship between an electrical current and a correspondent voltage. It is most often expressed via chart or graph. This information can be used to inform the user of the voltage dependence of the specific channel under test.
I-V Curve
I-V curve (also called the current-voltage curve) refers to the relationship between an electrical current and a correspondent voltage. It is most often expressed via chart or graph. This information can be used to inform the user of the voltage dependence of the specific channel under test.
Leakage Current
Leakage current refers to the undesirable loss of electrical current in transistors or other electronic equipment. In semiconductors, leakage of current or electrons occurs at the level of the transistor and is more common in especially minute components. When current is lost due to leakage, semiconductors inherently require more energy to operate and generate more heat as they attempt to bolster performance. Heat caused by current leakage can lead to failure of circuits and compromised functionality.
Leakage Current
Leakage current refers to the undesirable loss of electrical current in transistors or other electronic equipment. In semiconductors, leakage of current or electrons occurs at the level of the transistor and is more common in especially minute components. When current is lost due to leakage, semiconductors inherently require more energy to operate and generate more heat as they attempt to bolster performance. Heat caused by current leakage can lead to failure of circuits and compromised functionality.
Looping Compensation
When a control feedback loop causes unintended and undesirable oscillation, loop compensation is employed to stop or prevent it. It increases stability within the circuit for enhanced performance.
Looping Compensation
When a control feedback loop causes unintended and undesirable oscillation, loop compensation is employed to stop or prevent it. It increases stability within the circuit for enhanced performance.
Metal-Oxide Semiconductor Field Effect Transistor (MOSFET)
The metal-oxide semiconductor field effect transistor (abbreviated as MOSFET) is a commonly utilized semiconductor device that amplifies electronic signals. A semiconductor is comprised of synthetic materials that are not as conductive as the materials of a conductor, nor as insulating as materials that do not conduct electricity at all. When a specific amount of voltage is administered across the MOSFET system, it modifies the dispersion of electrical charges within the semiconductor. An important feature of the MOSFET is that its design allows for precise control of conduction and insulation. This is possible due to the construction of the device as well as the type of silicon (or other material) used to manufacture it.
Metal-Oxide Semiconductor Field Effect Transistor (MOSFET)
The metal-oxide semiconductor field effect transistor (abbreviated as MOSFET) is a commonly utilized semiconductor device that amplifies electronic signals. A semiconductor is comprised of synthetic materials that are not as conductive as the materials of a conductor, nor as insulating as materials that do not conduct electricity at all. When a specific amount of voltage is administered across the MOSFET system, it modifies the dispersion of electrical charges within the semiconductor. An important feature of the MOSFET is that its design allows for precise control of conduction and insulation. This is possible due to the construction of the device as well as the type of silicon (or other material) used to manufacture it.
Parametric Characterization
Parametric characterization testing offers detailed parameter analysis of various electronic testing devices (including curve tracers). Specially manufactured hardware and software combine to provide the user of the parametric testing device to characterize complex semiconductor processes and instruments easily and effectively. An important portion of parametric characterization is the verification and analysis of parametric failure. This term refers to a device's inability to meet the electrical requirements for a measurable attribute (for example, leakage current) that does not immediately affect the functionality of the device. Therefore a parametric failure may occur even if no issue with functionality is detected.
Parametric Characterization
Parametric characterization testing offers detailed parameter analysis of various electronic testing devices (including curve tracers). Specially manufactured hardware and software combine to provide the user of the parametric testing device to characterize complex semiconductor processes and instruments easily and effectively. An important portion of parametric characterization is the verification and analysis of parametric failure. This term refers to a device's inability to meet the electrical requirements for a measurable attribute (for example, leakage current) that does not immediately affect the functionality of the device. Therefore a parametric failure may occur even if no issue with functionality is detected.
Peak Power
Peak power refers to the maximum amount of power in a pulsed signal. Often, pulses are characterized by short pulse duration. This can inherently lead to incredibly high peak power in pulses that are relatively low in energy. For moderately long pulses, the peak power can be determined more directly.
Peak Power
Peak power refers to the maximum amount of power in a pulsed signal. Often, pulses are characterized by short pulse duration. This can inherently lead to incredibly high peak power in pulses that are relatively low in energy. For moderately long pulses, the peak power can be determined more directly.
Sample Rate
The sample rate is the number of samples from a continuous signal per unit of time in order to make a discrete signal.
Voltage/Current Sourcing
Voltage or current sourcing refers to the drawing of constant and direct power into or out of a device, specifically through a high-impedance node or terminal.
Voltage/Current Sourcing
Voltage or current sourcing refers to the drawing of constant and direct power into or out of a device, specifically through a high-impedance node or terminal.
Waveform Averaging
Waveform averaging (used to reveal a waveform's spectrum and other characteristics amid interference or noise) works by triggering data acquisition at precise moments within a repetitive production of a signal.
Waveform Averaging
Waveform averaging (used to reveal a waveform's spectrum and other characteristics amid interference or noise) works by triggering data acquisition at precise moments within a repetitive production of a signal.