Agilent HP E5061B

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  •  Equipment Location : USA
Description:
Agilent HP  The Keysight E5061B is a network analyzer, covering the broad frequency range of 5 Hz to 3 GHz , in one instrument. Applications range from general RF measurements such as filter and amplifier test to LF (low frequency) measurements such as loop-gain evaluation of DC-DC converters. The wide frequency coverage is also suitable for PDN (power delivery network) evaluation which is becoming more common.FEATURES Integrated T/R or S-parameter test set 50 or 75 ohm test port impedance 120 dB dynamic range and 0.005 dB rms trace noise Built-in Visual Basic for Applications (VBA) OPTIONS 005 Impedance analysis for LF-RF network analyzer010 Time domain/fault location analysis019 Standard hard disk drive020 Standard hard disk drive115 Transmission/Reflection test set, 100 kHz to 1.5 GHz, 50 ohm system impedance117 Transmission/Reflection test set, 100 kHz to 1.5 GHz, 75 ohm system impedance135 Transmission/Reflection test set, 100 kHz to 3 GHz, 50 ohm system impedance137 Transmission/Reflection test set, 100 kHz to 3 GHz, 75 ohm system impedance1A7 ISO 17025 compliant calibration1CM Rack mount kit1CN Front handle kit1CP Rack mount and front handle kit1E5 High stability timebase215 S-parameter test set, 100 kH

Refurbished

PRODUCT SPECS

(From Used-Line T&M Specifications )
  Keysight Technologies (Agilent HP) E5061B Specs (1.06 MB)
Instrument Type  S-Parameter  
Low end frequency limit  5.00 Hz 
High end frequency limit  3.00 GHz 
Output Power Range  –45 dBm to 10 dBm  
Input Noise Level  Noise level (referenced to full scale input level at 23°C ±5 °C): -95 dB  
Status -
Launch Date Nov-2009

E5061B is a network analyzer, covering the broad frequency range of 5 Hz to 3 GHz , in one instrument. Applications range from general RF measurements such as filter and amplifier test to LF (low frequency) measurements such as loop-gain evaluation of DC-DC converters. The wide frequency coverage is also suitable for PDN (power delivery network) evaluation which is becoming more common.

The E5061B RF Network Analyzer options are the successors of the E5061/62A and they provide high-performance network analysis for testing RF components, including cellular BTS filters/antennas, MRI coils, RFIDs, and CATV components. A wide variety of test set options allows you to select the best configuration to suit your test requirements and budget.

  • E5061B-115: Transmission/Reflection test set, 100 kHz to 1.5 GHz, 50 Ω system impedance
  • E5061B-215: S-parameter test set, 100 kHz to 1.5 GHz, 50 Ω system impedance
  • E5061B-135: Transmission/Reflection test set, 100 kHz to 3 GHz, 50Ω system impedance
  • E5061B-235: S-parameter test set, 100 kHz to 3 GHz, 50 Ω system impedance
  • E5061B-117: Transmission/Reflection test set, 100 kHz to 1.5 GHz, 75 Ω system impedance
  • E5061B-217: S-parameter test set, 100 kHz to 1.5 GHz, 75 Ω system impedance
  • E5061B-137: Transmission/Reflection test set, 100 kHz to 3 GHz, 75 Ω system impedance
  • E5061B-237: S-parameter test set, 100 kHz to 3 GHz, 75 Ω system impedance
  • E5061B-3L5: LF-RF network analyzer with DC bias source, 5 Hz to 3 GHz

The E5061B-3L5 LF-RF NA option offers versatile network analysis in the broad frequency range from 5 Hz to 3 GHz. Comprehensive LF network measurement capabilities including built-in 1 MΩ inputs have been seamlessly integrated with the high-performance RF network analyzer. The E5061B-3L5 is the right solution for component and circuit evaluations in the R&D environment.

The E5061B-005 provides the impedance analysis (ZA) firmware for the E5061B-3L5 LF-RF network analyzer. This option enables the analyzer to measure impedance parameters of electronic components such as capacitors, inductors, and resonators. The combination of NA and ZA capabilities further enhances the  versatility of the analyzer as a general R&D tool.

  • S-parameter test port, 5 Hz to 3 GHz, with a wide dynamic range of 120 dB at > 1MHz, 90 dB at < 100 Hz
  • Gain-phase test port, 5 Hz to 30 MHz, switchable 1 MΩ / 50 Ω input
  • DC bias source from 0 to ±40 Vdc, which can be added to AC test signal (for both S-parameter and gain-phase test port) or can be used as a sweepable DC source
  • Compact form factor with a 254-mm depth, requiring less desktop space
  • RF-NA option
    • 100 kHz to 1.5 GHz / 3 GHz
    • Transmission / Reflection test set and S-parameter test set
    • 50 Ω and 75 Ω system impedance
  • LF-RF NA option
    • 5 Hz to 3 GHz
    • 50 Ω S-parameter test set
    • Gain-phase test port (1 MΩ / 50 Ω inputs)
    • DC-bias source
    • Impedance analysis function (option 005)

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