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HOME Test and Measurement Analyzers Impedance Analyzers Agilent 4291A-TEST HEAD (OPT 014)

Agilent 4291A-TEST HEAD (OPT 014)

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Description of Agilent 4291A-TEST HEAD (OPT 014)

Categories: Analyzers, Impedance Analyzers

Manufacturer: Keysight Technologies (Agilent HP)

Model: 4291A

Condition: Used

HP/AGILENT 4291A-TEST HEAD (OPT 014) HIGH TEMPERATURE/LOW IMPEDANCE TEST HEAD

Product specifications of Agilent 4291A-TEST HEAD (OPT 014) (From Used-Line T&M Specifications)

  • Launch Date Jan-2049
  • Alternative E4991A RF Impedance/Material Analyzer
  • Status Discontinued by Manufacturer

For surface mount component evaluation and material testing the HP 4291A RF impedance / material analyzer is an integrated package designed to provide accurate testing at higher frequencies.

  • Impedance parameters: |Z|, θz, |Y|, θy, R, X, G, B, Cp, Cs, Lp, Ls, Rp, Rs, D, Q, |Γ|, θγ, Γx, Γy
  • Broad frequency coverage from 1 MHz to 1.8 GHz for testing RF compenents and materials
  • Frequency resolution: 1 mHz
  • Improved measurement accuracy and repeatability over an impedance range of 0.1 Ω to 50 kΩ
  • OSC levels
    • Voltage range: 0.2 mVrms to 1 Vrms
    • Current range: 4 µArms to 20 mArms
    • Power range: ‑67 dBm to 7 dBm
  • DC bias (Option 001)
    • DC voltage level: 0 to ±40 V
    • DC current level: 20 µA to 100 mA, ‑20 µA to ‑100 mA
    • DC level resolution: 1 mV, 20 µA
  • Surface mount device (SMD) test fixtures for different sizes of chip capacitors and inductors
  • Dielectric test fixture and built-in function for measuring permittivity, including Cole-Cole plot relaxation time (with Option 002 and the 16453A)
  • Magnetic test fixture and built-in function for measuring permeability of ferrite material (with Option 002 and 16454A)
  • Direct impedance and material parameter measurement versus time, humidity, or temperature (with Option IC2 and an external temperature chamber)
  • Evaluate components with dc bias up to ±100 mA and ±40 V (with Option 001)
  • Monitor test signals applied to the DUTs
  • Simulate a component with equivalent circuit analysis
  • Store the measurement data and analyzer settings on the DOS and LIF compatible 1.4 MB flexible disk drive and RAM disk memory
  • Markers and marker utilities
  • Limit lines for go/no-go testing
  • Sweep
    • Parameter: Frequency, OSC level (voltage), DC bias voltage/current
    • Setup: Start Stop, Center Span
    • Type: Linear, Log, Zero-span, List
    • Mode: Continuous, Single, Manual, Number of groups
    • Direction: Up sweep, Down sweep
    • Number of measuring points: 2 to 801 points
    • Averaging: Sweep average, Point average
    • Delay time: Point delay time, Sweep delay time
  • Calibration functions: Open/Short/50 Ω calibration, Low loss calibration
  • Compensation functions: Open/Short/Load compensation, Port extension, Electric length
  • External reference input
    • Frequency: 10 MHz (typical)
    • Level: >-6 dBm (typical)
  • Internal reference output
    • Frequency: 10 MHz (nominal)
    • Level: 2 dBm (typical)
  • External trigger input
    • Level: TTL
    • Pulse width: >2 µs (typical)
  • Display: Color CRT, 7.5 inch, 512 x 400 resolution, 2 channels; single, dual split or overwrite, graphic, tabular; 1 trace/channel for measurement, 16 traces/channel for memory
  • HP-IB interface: SH1, AH1, T6, TE0, L4, LE0, SR1, RL1, PP0, DC1, DT1, C1, C2, C3, C4, C11, E2
  • Connector type: APC7

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