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HOME Test and Measurement Generators Pattern Generators Agilent 16522A-SYS2TTL

Agilent 16522A-SYS2TTL

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Description of Agilent 16522A-SYS2TTL

Categories: Generators, Pattern Generators

Manufacturer: Keysight Technologies (Agilent HP)

Model: 16522A

Condition: Used

Seller: Test Equipment Connection Corp.

Keysight (formerly Agilent) 16522A-SYS2TTL Digital Pattern Generator ModuleThe HP 16522A

Digital Pattern Generator ModuleThe HP 16522A pattern generator module is an expandable stimulus tool designed for the HP 16500B/C Logic Analysis System. It provides digital design teams the ability to emulate missing devices and to functionally test prototypes.Key Characteristics:Output channels: 20 channels at 200 MHz clock; 40 channels at 100MHz clock.Memory depth: 258,048 vectors.Logic levels (data pods): TTL, 3-state TTL/3.3v, 3-state TTL/CMOS,ECL terminated, ECL unterminated, and differential ECL (without pod).Data inputs: 3-bit pattern - level sensing (clock pod).Clock outputs: Synchronized to output data, delay of 11 ns in9 steps (clock pod).Clock input: DC to 200 MHz (clock pod).Internal clock period: Programmable from 5 ns to 250 ms in a 1, 2, 2.5,4, 5, 8 sequence.External clock period (user supplied): DC to 200 MHz.External clock duty cycle: 2 ns minimum high time.Maximum number of "IF condition" blocks at 50 MHz clock: 1.Maximum number of different macros: 100.Maximum number of lines in a macro: 1024.Maximum number of macro invocations: 1,000.Maximum number of Repeat loop invocations: 1,000.Maximum number of Wait event patterns: 4.ii
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Product specifications of Agilent 16522A-SYS2TTL (From Used-Line T&M Specifications)

  • Launch Date Jan-2049
  • Status Discontinued by Manufacturer

The Agilent 16522A digital pattern generator module is the perfect tool for functional testing of your digital design. The pattern generator allows you to check the functional characteristics of your system. See how your system responds to unanticipated signals or clock speeds. Correlate data captured with other Agilent logic analysis system modules to verify correct operation. Use the pattern generator module in automated test environments to run design qualification tests quickly, using only one instrument. Save time normally spent developing custom test hardware used for stimulus.

  • Vectors up to 200 bits wide
  • Synchronized Clock Output
  • Wait for input pattern
  • Output Channnels: 20 channels at 200 MHz clock; 40 channels at 100 MHz clock
  • Memory Depth: 258,048 vectors
  • Logic Levels (data pods): TTL, 3-state TTL/3.3v, 3-state TTL/CMOS, ECL terminated, ECL unterminated, and differential ECL (without pod)
  • Data Inputs: 3-bit pattern level sensing (clock pod)
  • Clock Output: Synchronized to output data, delay of 11 ns in 9 steps (clock pod)
  • Clock Input: DC to 200 MHz (clock pod)
  • Internal Clock Period: Programmable from 5 ns to 250 us in a 1, 2, 2.5, 4, 5, 8 sequence
  • External Clock Period: DC to 200 MHz
  • External Clock Duty Cycle: 2 ns minimum high time
  • Maximum Number of "IF Condition" Blocks at 50 MHz: 1
  • Maximum Number of Different Macros: 100
  • Maximum Number of Lines in a Macro: 4096
  • Maximum Number of "Wait" Event Patterns: 4

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